Development of Scanning Near-field Optical Microscope Using a Spherical Small Protrusion as a Probe.
نویسندگان
چکیده
منابع مشابه
Near-field scanning optical microscope probe analysis.
In this article results of a comparison of two NSOM probe characterization methods are presented. Scanning electron microscopy analysis combined with electromagnetic field modeling using the finite difference in time domain method are compared with measured far-field radiation diagrams of NSOM probes. It is shown that measurement of far-field radiation diagrams can be an efficient tool for dail...
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ژورنال
عنوان ژورنال: Journal of the Japan Society for Precision Engineering
سال: 1994
ISSN: 1882-675X,0912-0289
DOI: 10.2493/jjspe.60.1122